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IEEE Test and Reliability at
Design, Automation & Test in Europe
(DATE 2013)
March 18-22, 2013
Grenoble, France

http://www.date-conference.com

CALL FOR PAPERS
Scope
The Design, Automation & Test in Europe Conference and Exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. The five-day event includes plenary invited papers, regular papers, panels, hot-topic sessions, tutorials and workshops, two special-focus days, and a track for executives. DATE, with its many user-group meetings, fringe meetings, and social events, offers a wide variety of opportunities to meet and exchange information.
Submissions

Test, Design-for-Test, and Reliability in the broad sense are important topics and integral part of DATE, which is technically co-sponsored by the Test Technology Technical Council (TTTC). One of the parallel conference tracks is devoted to Test and Reliability, and also tutorials, exhibition booths, and workshops cover these topics. You are invited to participate in DATE’13 and send in one or more submissions of the following types.

Paper Submissions

Topic T1: Test for Defects, Variability, and Reliability
Chairs: Bram Kruseman, NXP Semiconductors (NL); Jaume Segura, Universitat de les Illes Balears (ES)
Defects and degradation mechanisms; physical sources of errors, incl. physical defects, signal integrity problems, PVT variations, and circuit reliability issues; design and test for robustness against PVT variations and circuit reliability.
Topic T2: Test Generation, Simulation, and Diagnosis
Chairs: Grzegorz Mrugalski, Mentor Graphics (PL); Bernd Becker, Universität Freiburg (DE)
Test pattern generation; high-level TPG; delay TPG; fault simulation; test generation for validation, debug and diagnosis; low-power TPG; TPG for memories and FPGAs.
Topic T3: Test for Mixed-Signal, Analog, RF, and MEMS
Chairs: Abhijit Chatterjee, Georgia Institute of Technology (USA); Haralampos Stratigopoulos, TIMA (FR)
Test, diagnosis, and tuning techniques for MS systems, MEMS, RF; defect modeling, test coverage metrics, statistical modeling, fault simulation, test generation, DfX techniques, BIST and BISR.
Topic T4: Test Access, Design-for-Test, Test Compression, System Test
Chairs: Sybille Hellebrand, Paderborn University (D); Rohit Kapur, Synopsys (USA)
DfT for SOCs, SIPs, NOCs, and 3D-ICs; built-in and embedded test and diagnosis; test data compression, low-power DfT and BIST; design-for-debug, diagnosis, and manufacturability; system-level test.
Topic T5: On-Line Testing and Fault Tolerance
Chairs: Cecilia Metra, Università di Bologna (IT); Lorena Anghel, TIMA (FR)
On-line and concurrent testing and diagnosis; fault tolerance; dependability; security; robust design.

Proposals for Special Sessions
Chairs: Nicola Nicolici, McMaster University (CAN); Zebo Peng, Linköpings Universitet (SE)
Special Sessions can take various forms:

Embedded Tutorials, providing technical education sessions for a broad audience,
Hot-Topic Sessions, dealing with the introduction and discussion of new R&D problems,
Panels, discussing visionary and/or controversial issues.

Proposals for Full-Day or Half-Day Tutorials– Chair: Franco Fummi, Università di Verona (IT)
Tutorials are relevant and topical educational sessions, taught by leading experts.
Proposals for University Booth Presentations– Chairs: Laurent Fesquet, IMAG (FR); Andreas Vörg, edacentrum (DE)
Universities and research institutes can showcase their pre-commercial results and prototype demos.Proposals for Presentations at the Exhibition Theatre – Chair: Jürgen Haase, edacentrum (DE)
The Exhibition Theatre offers an open discussion forum at DATE’s exhibition, including panel sessions and customer testimonials.
Proposals for Full-Day Workshops – Chairs: Lorena Anghel, TIMA (FR); Cristiana Bolchini, Politecnico di Milano (IT)
On Friday, DATE hosts a number of parallel workshops on emerging research and application topics.
Proposals for Fringe Meetings – Contact: Claire Cartwright, European Conferences (UK)
A limited number of rooms is available for related open and closed meetings.

Submission instructions for the various types of submissions are specified at http://www.date-conference.com.
Key Dates

Submission deadline:  September 9, 2012 (papers, special sessions, tutorials proposals, workshop proposals)
Submission deadline:  October 22, 2012 (exhibition theatre)
Notification of acceptance:  November 16, 2012
Camera-ready manuscripts:  December 16, 2012
Submission deadline:  January 14, 2013 (university booth proposals)

Additional Information

Erik Jan Marinissen – Program Chair
IMEC – Leuven, Belgium
e-mail: erik.jan.marinissen@imec.be

Enrico Macii – General Chair
Politecnico di Torino – Torino, Italy
e-mail: enrico.macii@polito.it

Committees

TBA
For more information, visit us on the web at: http://www.date-conference.com

The IEEE Test and Reliability at Design, Automation & Test in Europe (DATE 2013) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

PAST CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

TTTC 1ST VICE CHAIR
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

SECRETARY
Joan FIGUERAS
UPC Barcelona Tech - Spain
Tel. +
E-mail figueras@eel.upc.edu

ITC GENERAL CHAIR
Doug YOUNG
BVC Industrial - USA
Tel. +1-602-617-0393
E-mail doug0037@aol.com

TEST WEEK COORDINATOR
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS
University of Athens - Greece
Tel. +30-210-7275145
E-mail dgizop@di.uoa.gr

STANDARDS
Rohit KAPUR
Synopsys, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Matteo SONZA REORDA
Politecnico di Torino - Italy
Tel.+39-011-564-7055
E-mail matteo.sonzareorda@polito.it

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

ELECTRONIC MEDIA
Giorgio DI NATALE
LIRMM - France
Tel. +33-4-6741-8501
E-mail giorgio.dinatale@lirmm.fr

  

PRESIDENT OF BOARD
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

SENIOR PAST CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

TTTC 2ND VICE CHAIR
Rohit KAPUR
Synopsys, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

FINANCE
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

IEEE DESIGN & TEST EIC
Krish CHAKRABARTY
Duke University - USA
Tel. +1-
E-mail krish@ee.duke.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG
Alcatel-Lucent - USA
Tel. +1-973-386-6759
E-mail chen-huan.chiang@alcatel-lucent.com

TECHNICAL ACTIVITIES
Patrick GIRARD
LIRMM – France
Tel.+33 467 418 629
E-mail patrick.girard@lirmm.fr

ASIA & PACIFIC
Kazumi HATAYAMA
NAIST - Japan
Tel. +81 743 72 5221
E-mail k-hatayama@is.naist.jp

LATIN AMERICA
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

NORTH AMERICA
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

COMMUNICATIONS
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com